- field probe
- зонд для изменения напряженности поля
Англо-русский словарь по ядерным испытаниям и горному делу. 2013.
field probe
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magnetic-field probe — magnetinio lauko zondas statusas T sritis fizika atitikmenys: angl. magnetic probe; magnetic field probe vok. Magnetfeldsonde, f; magnetische Sonde, f; Magnetsonde, f rus. магнитный зонд, m pranc. sonde magnétique, f … Fizikos terminų žodynas
Field ion microscope — Field ion microscopy (FIM) is an analytical technique used in materials science. The field ion microscope is a type of microscope that can be used to image the arrangement of atoms at the surface of a sharp metal tip.It was the first technique by … Wikipedia
Field emission microscopy — (FEM) is an analytical technique used in materials science to investigate molecular surface structures and their electronic properties. [cite web | title = Intro to Field Emission | publisher = Field Emission / Ion Microscopy Laboratory, Purdue… … Wikipedia
Field electron emission — It is requested that a diagram or diagrams be included in this article to improve its quality. For more information, refer to discussion on this page and/or the listing at Wikipedia:Requested images. Field emission (FE) (also known as field… … Wikipedia
field-ion microscope — /feeld uy euhn, uy on/ a device in which the atomic structure of the surface of a conductor is made visible by introducing helium gas into the device and applying a high voltage to ionize and accelerate the gas toward a fluorescent screen. Cf.… … Useful english dictionary
magnetic probe — magnetinio lauko zondas statusas T sritis fizika atitikmenys: angl. magnetic probe; magnetic field probe vok. Magnetfeldsonde, f; magnetische Sonde, f; Magnetsonde, f rus. магнитный зонд, m pranc. sonde magnétique, f … Fizikos terminų žodynas
Langmuir probe — A Langmuir probe is a device named after Nobel Prize winning physicist Irving Langmuir, used to determine the electron temperature, electron density, and electric potential of a plasma. It works by inserting one or more electrodes into a plasma,… … Wikipedia
Near-field scanning optical microscope — Near field scanning optical microscopy (NSOM/SNOM) is a microscopic technique for nanostructure investigation that breaks the far field resolution limit by exploiting the properties of evanescent waves. This is done by placing the detector very… … Wikipedia
Test probe — Typical passive oscilloscope probe being used for testing an integrated circuit. A test probe (test lead, test prod, or scope probe) is a physical device used to connect electronic test equipment to the device under test (DUT). They range from… … Wikipedia
Hall probe — A Hall probe is a semiconductor based detector which uses the Hall effect to allow the strength of a magnetic field to be measured.The Hall Probe is a device that is used to measure magnetic field. It contains an indium compound crystal mounted… … Wikipedia
Atom probe — The atom probe is an atomic resolution microscope used in materials science that was invented in 1967 by Erwin Müller, J. A. Panitz, and S. Brooks McLane [cite journal|last=Müller|first=Erwin W.|authorlink=Erwin Müller|coauthors=John A. Panitz, S … Wikipedia
